Web炭化珪素半導体層に形成された半導体素子と、 前記半導体素子の終端部に形成され、JTE(Junction Termination Extension)領域 およびFLR(Field Limiting Ring)の少なくとも片方を含む不純物注入領域である終 端領域とを備え、 WebFeb 19, 2024 · This paper presents an overall optimization procedure and the electrical performances of 1.2 kV/10 A 4H-SiC junction barrier Schottky (JBS) diodes with high current density. To achieve high current density, the epi-layer, the design parameters for active region including p-grid width and cell pitch, and the field limiting ring for edge …
EP0661753A1 - Semiconductor structure with field …
WebJan 23, 2015 · The FLRs technology is thought to be the most suitable terminal technology for high voltage SiC devices because it has a good tolerance to implantation dose and no … WebAbstract. Excellent voltage blocking capability and reliability can be obtained by trenching the field-limiting ring site which would be implanted. The trench etch step makes the junction depth deeper so that junction curvature effect and surface breakdown are less happened. The numerical analyses reveal two facts that the trenched field ... bleach ファンクラブ 入会
Design and Characteristics of an Etching Field Limiting Ring for …
WebThe SiC-SBD without the Al-deposited edge termination shows less than 250 V breakdown voltage, while the Al-deposited guard ring and Al-deposited guard ring-assisted FLR … Web例文帳に追加. 電圧阻止領域を形成するフィールドリミッティングリング( Field Limiting Ring )とフィールドプレートを備え、阻止電圧の安定化と信頼性の向上を図る高耐圧の半導体装置の提供。. - 特許庁. In the anode electrode 3, an anode main … WebPotential and strength of surface electric field distribution have strongly influence on breakdown voltage and reliability of power semiconductor devices. Potential distribution … bleach ファンクラブ 入会方法